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FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1806-1807
- Print publication:
- July 2012
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Microstructure of As-implanted and Annealed Si:Mn Dilute Magnetic Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1720-1721
- Print publication:
- August 2005
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- Article
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Magnetic and Structural Properties of Mn-implanted Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 853 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, I8.4
- Print publication:
- 2004
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